Impact of FinFET and III-V/Ge technology on logic and memory cell behavior

نویسنده

  • E. Amat
چکیده

In this work, we assess the performance of a ring oscillator and a DRAM cell when they are implemented with different technologies (planar CMOS, FinFET and III-V MOSFETs), and subjected to different reliability scenarios (variability and soft errors). FinFET-based circuits show the highest robustness against variability and soft error environments.

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تاریخ انتشار 2013